18/11/2008 The Ambassador of Japan Visits Art Diagnosis Centre.

On 18/11/2008, Ambassador of Japan to Greece, Ambassador Takanori Kitamura and his wife Madam Kitty, visit the Art Diagnosis Centre of Ormylia Foundation. During his toured to the Centre, Ambassador has been informed about the facilities and the activities of the Art Diagnosis Centre and met with the staff.

13/11/2008 Reportage of ARTE TV

A reportage of ARTE TV with subject in the activities of program MED-COLOUR-TECH in Art Diagnosis Centre of Ormylia Foundation.

04/09/2008 Art - Dye Another Way

A reportage of EURONEWS with subject in the activities of program MED-COLOUR-TECH with title "Art – Dye Another Way: The Secret Agents of Colour" in Art Diagnosis Centre of Ormylia Foundation.

13/06/2008 International Workshop
Information processing and knowledge management applications in cultural heritage and conservation science

Information processing and knowledge management applications in cultural heritage and conservation science
International Workshop Supported by
(05ΑΚΜΩΝ83 and INCO-CT-2005-015338)
13th of June 2008, «ORMYLIA» Foundation, Chalkidiki

The conservation science is a scientific field involving contributions from many and different scientific disciplines. Advanced technologies are being developed for the analytical investigation of artworks contributing multivariate data for the documentation or completion of historical and archaeological data.
State of the art data and information processing and management systems are solicited to optimally merge and cross-evaluate the information that may be potentially revealed from the acquired and stored pertinent data after the combination of methods and techniques from the different scientific fields (i.e. multispectral images and spectra, multivariate data produced from the combination of variable physicochemical spectroscopic techniques, textual archives, multimedia content and other).
Research work is performed within this field combining optimal data acquisition, processing and management, associated with the development of novel – integrating techniques and methods targeting to a multidisciplinary approach and providing integrated solutions.
The merit and the added value of the application and further development of the signal/image and in general of the information processing techniques applied to the analytical, data in the field of conservation is not sufficiently exploited and should be intensively pushed forward. This is a mission that engineers and conservation scientists should jointly undertake. The assimilation of efforts of both side techniques is a prerequisite for a concrete collaboration to be setup.
Within this context we would appreciate to receive any scientific contributions on the following indicative topics:

• Signal and image processing supporting novel non destructive testing techniques applied in art objects and monuments.
• Knowledge management of cultural heritage assets including semantics. Applications based on the CIDOC CRM are encouraged to be presented.
• Information processing and analytical data fusion acquired from artworks.
• Alternatively, contributions could be focused in presenting recent innovative and applied research developments combining any of the aforementioned topics.

Contact details:

Georgios Karagiannis
Konstantinos Vavliakis
Ormylia Foundation, Art Diagnosis Centre
tel: (30) 2371098400
mob: (30) 6977236895
fax: (30) 2371098402

www.ormyliafoundation.gr

10/05/2007 SEMINAR
SPM SCANNING PROBE MICROSCOPY & AFM ATOMIC FORCE MICROSCOPE

VEECO – a pioneering Metrology company – continues to break new ground in the development of modern techniques and new applications. Within this framework, “ANALYTICAL INSTRUMENTS S.A. Dr. C. J. VAMVAKAS – SCIENTIFIC EQUIPMENT” company, in cooperation with Veeco, is honoured to invite you to attend a seminar, to be held on Thursday, May 10, 2007 at 09:00 at the Seminar Hall of “ORMYLIA” Foundation ART DIAGNOSIS CENTRE, located in Ormylia, Halkidiki, on recent developments in Scanning Probe Microscopy (SPM) and Atomic Force Microscope (AFM).